Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)
نویسندگان
چکیده
منابع مشابه
Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM).
In this work we present a new AFM based approach to measure the local dielectric response of polymer films at the nanoscale by means of Amplitude Modulation Electrostatic Force Microscopy (AM-EFM). The proposed experimental method is based on the measurement of the tip-sample force via the detection of the second harmonic component of the photosensor signal by means of a lock-in amplifier. This...
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In this work we present a new AFM based approach to measure the local dielectric response of polymer films at the nanoscale by means of Amplitude Modulation Electrostatic Force Microscopy (AM-EFM). The proposed experimental method is based on the measurement of the tip–sample force via the detection of the second harmonic component of the photosensor signal by means of a lock-in amplifier. This...
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ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2011
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2011.05.001